Measuring signal and noise waveforms in high speed digital
circuitry, switching power supplies, or in the presence of interference
such as ESD can easily produce erroneous results. This one-day seminar
discusses several sources of error that can occur in making laboratory
measurements on electronic circuits utilizing frequencies in the hundreds
of megahertz range. Special attention is paid to high frequency effects
on scope and current probes, and pickup loops. Proper measurement
procedures, as well as inexpensive and easy-to-build noise measuring probes
are described. The techniques discussed are equally useful for high
frequency signal and/or noise measurement. Each technique is demonstrated
through in-class experiments and demonstrations.
This seminar is presented by Douglas C. Smith, author of the book, High Frequency Measurements and Noise in Electronic Circuits. Many of the techniques presented were developed by Mr. Smith and originally published in his technical papers and book.
This seminar is also offered in a two day format. The two day version adds more in-depth information on signal integrity measurements and provides time for additional demonstrations.
Outline